• title: Microelectronics and Reliability
    issn: 0026-2714
    eissn:
    publisher: Oxford$$Pergamon Press
登录号 年 卷 期
J068080 2001 41 9-12
J067675 2001 41 4-8
J066842 2001 41 1-3
J065855 2000 40 11-12
J065283 2000 40 8-10
J065282 2000 40 6-7
J065281 2000 40 4-5
J064572 2000 40 1-3
J063643 1999 39 9-12
J063055 1999 39 5-8
J063054 1999 39 1-4
J061798 1998 38 9-12
J061797 1998 38 5-8
J060956 1998 38 1-4
J059034 1997 37 5-8
J058341 1997 37 1-4
J060955 1997 37 9-12
J058340 1996 36 10-12
J057320 1996 36 5-9
J057319 1996 36 1-4
J055665 1995 35 5-12 Index
J054660 1995 35 1-4
J053706 1994 34 9-12
J053266 1994 34 5-8
J053265 1994 34 1-4
J051689 1993 33 11-15
J051688 1993 33 7-10
J050912 1993 33 1-6
J050077 1992 32 7-12
J049456 1992 32 1-6
J049074 1991 31 1-3
J049077 1991 31 4-6
J047166 1990 30 1-6
J045489 1989 29 1-6
J043804 1988 28 1-6
J042394 1987 27 4-6
J042393 1987 27 1-3
J040853 1986 26 1-3
J040852 1986 26 4-6
J039863 1985 25 4-6
J039069 1985 25 1-3
J037624 1984 24 4-6
J037177 1984 24 1-3
J035978 1983 23 4-6
J035977 1983 23 1-3
J034971 1982 22 4-6
J034970 1982 22 1-3
J033931 1981 21 1-6
J033233 1980 20 1-6
J030971 1979 19 1-6
J029975 1978 17 1-6
J028043 1977 16 1-6
J026922 1976 15 1-6
J026322 1975 14 1-6
J025068 1974 13 1-6
J023937 1973 12 1-6
J022937 1972 11 1-6
J021961 1971 10 1-6
J021423 1970 9 1-6
J020424 1968-69 7-8
J018782 1967 6 1-4
J015978 1966 5 1-4
J016663 1965 4 1-4
J013709 1964 3 1-4