题名: Scanning Electron Microscopy and X-ray Microanalysis
作者: Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles E. Lyman, Eric Lifshin, Linda Sawyer, Joseph R. Michael
索书号: http://link.springer.com/openurl?genre=book&isbn=978-1-4613-4969-3
